发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To omit the outer mount of a drain protection diode by a method wherein the protection diode is formed in the neighborhood except the operating region of a transistor, and both ends thereof are connected to the source and drain electrodes of the transistor. CONSTITUTION:The drain protection diode 15 is provided except the operating region of the MOS-FET 10 on the same semiconductor substrate 16 as the MOS- FET 10, and formed in the neighborhood of the drain region of the MOS-FET 10. Therefore, the protection by the diode is performed, by designing the withstand voltage of the protection diode lower than the drain withstand voltage of the MOS-FET, at the time of impressing surge onto the drain terminal of the MOS-FET, accordingly the electrostatic breakdown of the drain terminal is pevented.
申请公布号 JPS5944872(A) 申请公布日期 1984.03.13
申请号 JP19820155501 申请日期 1982.09.07
申请人 TOKYO SHIBAURA DENKI KK 发明人 NISHINO OSAMU
分类号 H03F1/52;H01L27/02;H01L27/06;H01L29/78;H02H7/20;H03F1/42 主分类号 H03F1/52
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