发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To prevent a cavity formed on a substrate from being deformed by thermal treatment for an epitaxial growth by a method wherein the cavity is formed on the substrate by chemical etching and a surface layer is removed by dry etching and then semiconducltor layers are formed on the substrate by an epitaxial growth. CONSTITUTION:On an n type InP substrate an n type InP buffer layer 2 and a p type InP current blocking layer 3 are formed by an epitaxial growth and SiO2 film 4 is formed. Then an aperture of stripe-form is formed on the film 4. A V-groove 6 is formed by chemical etching. Then the film 4 is removed selectively by HF and products of the chemical etchin gare removed by dry etching. After that an n type InP cladding layer 7, a non-doped InGaAsP activated layer 8, a p type InP cladding layer 9 and a p type InGaAsP contact layer 10 are successively formed in the V-groove 6 by a liquid phase epitaxial growth. |
申请公布号 |
JPS5944817(A) |
申请公布日期 |
1984.03.13 |
申请号 |
JP19820157220 |
申请日期 |
1982.09.07 |
申请人 |
FUJITSU KK |
发明人 |
UEDA OSAMU;TANAHASHI TOSHIYUKI |
分类号 |
H01L21/302;H01L21/20;H01L21/3065;H01S5/00 |
主分类号 |
H01L21/302 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|