发明名称 APPARATUS FOR MEASURING HIGH FREQUENCY CHARACTERISTIC
摘要 PURPOSE:To facilitate the insertion of the titled apparatus to a signal source side and to drastically improve a high frequency measuring error while electrical characteristics of a measuring system itself are made stable to enable easy measuring operation, by perfectly electronizing a measuring signal change- over means with respect to an apparatus to be measured. CONSTITUTION:D1, D2 in a high frequency electronic switch circuit module 9 are connected between the high frequency output terminal 0 of a sweep oscillator 1 and the input output terminals 3, 4 of an apparatus 2 to be measured through connecting condensers C3, C4 or the like and a diode is used as a high frequency electronic switch circuit while the output sides thereof are respectively connected to directional coupling apparatuses 5, 6. Lo, Co, L1+C1 or the like respectively constitute a high frequency inhibiting circuit. The outputs of the directional coupling apparatuses 5, 6 are sent to vertical input terminals V1, V2 of a cathode ray oscilloscope and a sweep signal P1 is sent to a horizontal terminal H. When importance is set on matching characteristics of the input and the output sides, ATT2 or ATT3 may be controlled to adjust an input level to the cathode ray oscilloscope 7 and, if the intensity of the input signal is adjusted with attention to a display level, observation can be accurately and rapidly performed.
申请公布号 JPS5943369(A) 申请公布日期 1984.03.10
申请号 JP19820154911 申请日期 1982.09.06
申请人 NIPPON DENKI KK 发明人 WAKAMATSU SHIGEMI
分类号 G01R27/28;(IPC1-7):01R27/28 主分类号 G01R27/28
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