| 摘要 |
PURPOSE:To shorten a test time, by connecting each circuit required for measuring a function of an operable LSI, to each CPU separately within the same time. CONSTITUTION:Other CPU6 whose address is same as that of a CPU1 is provided, the address line is connected in a common state, and a circuit being operable within the same time is fitted to each separate CPU, respectively. When an instruction from the CPU1 is received, a power-supply voltage setting circuit for an element to be measured 2 is operated, and the prescribed bias potential is set to a power-supply voltage terminal of the element to be measured. Subsequently, an instruction of the CPU6 operates a frequency setting circuit 3, and simultaneously, an instruction of the CPU1 operates a frequency measuring circuit 4. Subsequently, a non-defective or defective deciding circuit 5 receives an instruction from the CPU1 and operates, and discriminates a non-defective unit from a defective unit. |
