发明名称 Manufacture of wafer-scale integrated circuits
摘要 In the course of manufacturing a wafer-scale integrated circuit, the metalization for interconnection both within each cell and between cells is achieved by the etching of a single metal layer, photoresist being deposited on the layer and exposed using a step-and-repeat mask for those areas within each cell and using a whole-wafer reticle mask for the areas of interconnection between the cells.
申请公布号 US4435498(A) 申请公布日期 1984.03.06
申请号 US19810328339 申请日期 1981.12.07
申请人 BURROUGHS CORPORATION 发明人 BAILLIE, ALAN G.
分类号 G03F7/26;H01L21/768;(IPC1-7):G03C5/00 主分类号 G03F7/26
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