| 摘要 |
PURPOSE:To fabricate a test pattern required in testing the function of IC in good efficiency without performing manual work, by mounting a means for applying input selecting control (DRE) data and comparing-selecting control data (CPE) in the input and output common terminal of a master IC. CONSTITUTION:A CPE signal and a DRE signal are obtained from an address latch control signal (ALE), a memory laed control signal (MRD), an I/O lead control signal (IORD), a memory write control signal (MWR) and an I/O lead control signal (IOWR) generated and used in peripheral circuits of a microprocessor (UPU) 11 and/or a master IC 12a by a control data write-in circuit 152 to be stored as control data corresponding to the partial data pattern memory 154a of a test pattern memory region 15b and a test pattern with the CPE and the DRE signals can be obtained in the region 15b without performing manufal work. The test pattern is transmitted to a test pattern memory region 25b and the functional test of an IC(DUT)12b being an object to be tested is performed. |
