发明名称 Apparatus for measuring deformation
摘要 Arranged in succession on a common optical axis is a laser, a modulator for shifting the frequency of light produced by the laser, an optical system for forming two light beams, a system of markers formed on the surface of a specimen being tested and a recorder of an interference pattern resulting from the interference of light scattered by the markers.
申请公布号 US4432239(A) 申请公布日期 1984.02.21
申请号 US19810328477 申请日期 1981.12.08
申请人 BYKOV, ANATOLY P. 发明人 BYKOV, ANATOLY P.
分类号 G01B11/16;G01L1/24;(IPC1-7):G01L1/24 主分类号 G01B11/16
代理机构 代理人
主权项
地址