发明名称 METHOD FOR DETECTING HIGH SPOT ON PROFILE OF STRIP SHAPED MATERIAL
摘要 <p>PURPOSE:To perform highly accurate detection, by finding minimum points on the profile of a strip shaped material, sequentially connecting the minimum points, obtaining a bent reference line, obtaining the deviation between said approximated line and the actually measured value, and detecting a high spot. CONSTITUTION:An X ray plate thickness gage 12 can be freely moved in the direction of the width of a steel strip 10 by wheels 12a. The detected output of a width direction movement detector 14 and the plate thickness at each point in the width direction of the steel strip 10 are inputted to an operating device 16. The operating device 16 sequentially scans the actually measured value at each point in the width direction and finds the minimum point. Said minimum points are sequentially connected, and a bent first reference line is obtained. Then a second reference line, which is the approximated curve of the entire first reference line, is obtained. The deviation between the second reference line and the actually measured value is obtained. The part, where the deviation becomes larger than an allowable value is determined as a high spot. The judged result of the operating device 16 is displayed on an oscilloscope 18 and printed by an X-Y plotter 20.</p>
申请公布号 JPS5930010(A) 申请公布日期 1984.02.17
申请号 JP19820140451 申请日期 1982.08.12
申请人 KAWASAKI SEITETSU KK 发明人 URANO AKIRA;KITAO SEIJI;HIROSE YUUJI;NAGAI ISAO;MATSUMOTO KOUICHI;FUNAHASHI TAKAHIKO
分类号 B21C51/00;G01B15/02;G01B21/08;G01B21/20;G01B21/30;G01N25/00 主分类号 B21C51/00
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