| 摘要 |
<p>A test pin is disclosed which has a tubular shaped housing, a plunger with a contacting end that is slidably mounted within the housing, a spring carried in the housing for yieldingly biasing the plunger away from the spring, and means to offset the plunger to one side, whereby electrical contact between the plunger and the housing is improved. The offset means is an upper smaller diameter portion of the spring bent to one side, the upper portion engaging the plunger.</p> |
