发明名称 Semiconductor memory device
摘要 In a semiconductor memory device of the present, due to a heavily doped region formed on the semiconductor substrate, the depletion layer does not spread deeply toward the interior of the semiconductor substrate. In addition, a capacitor is formed by the heavily doped region, an insulating film formed on this region and a semiconductor layer formed on this insulating film. As a result, variation of capacitance of the capacitor due to alpha -ray particles is low. Furthermore, information is stored in the semiconductor layer which is formed above the semiconductor substrate so that the occurrence of a soft error is minimized.
申请公布号 US4432006(A) 申请公布日期 1984.02.14
申请号 US19800182671 申请日期 1980.08.29
申请人 FUJITSU LIMITED 发明人 TAKEI, AKIRA
分类号 H01L27/10;G11C5/00;H01L21/8242;H01L23/556;H01L27/108;H01L29/36;H01L29/78;H01L29/94;(IPC1-7):H01L27/04;G11C11/40 主分类号 H01L27/10
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