发明名称 Arrangement for the contactless measuring of electrical charge patterns in electroradiographic recording processes
摘要 In this arrangement, a high-resolution evaluation of the electronic charge pattern is to be made possible without destroying it and a dependence on fluctuations in the spacing between the charge pattern and the measuring arrangement and problems with drift and offset voltages of the charge amplifiers are to be avoided. For this purpose, the invention provides for the use of a dynamic field probe matrix for scanning the potential pattern. After the scanning, the charge pattern can be developed in the manner known from xerography and treated further, and the scanned values can be supplied for electronic evaluation and a reproduction on a television screen. An arrangement according to the invention can be used, in particular, in medical X-ray diagnostics. <IMAGE>
申请公布号 DE3228833(A1) 申请公布日期 1984.02.09
申请号 DE19823228833 申请日期 1982.08.02
申请人 SIEMENS AG 发明人 FEIGT,INGMAR,DR.;WERSING,WOLFRAM
分类号 G01R29/24;G03G15/054;(IPC1-7):H04N5/30;A61B6/00;G01T1/00;G03G21/00;H04N3/15 主分类号 G01R29/24
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