| 摘要 |
PURPOSE:To measure easily thickness of a zirconium barrier, and to measure it with high accuracy, by irradiating X-rays and measuring the intensity of secondary X-rays of Sn generated from a zirconium alloy. CONSTITUTION:X-rays generated from an X-ray tube 1 are irradiated to a zirconium barrier 2 of the inside circumferential face of a zirconium alloy 3, and intensity of SnKalpha and SnKbeta generated from the alloy 3 is measured by a detector 4. Or the X-rays of the X-ray tube 1 are scattered through a filter 5, the X-rays are absorbed, prescribed X-rays are irradiated to the barrier 2, and said measurement is executed. The measured intensity of SnKalpha, SnKbeta is varied in accordance with thickness if thickness of the barrier 2 is varied. Accordingly, thickness of the zirconium barrier of the inside circumferential face of a coated pipe of a zirconium alloy can be quantified with high accuracy by collating it with a gauging line. |
