发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent the corrosion of electrodes and the crack of a semiconductor chip without deteriorating electric characteristics by forming a laminate structure of a titanium layer and an alloy layer which mainly contains gold and germanium on a semiconductor chip mounting base mounting surface side. CONSTITUTION:A P type region 32 and an N type region 33 are formed on the inner surface of an N type silicon wafer 31, thereby constructing many N-P- N type transistors 34. A titanium layer 35 is deposited in a thickness of approx. 1,000Angstrom on the mounting surface of a lead frame 21 of the transistors 34. An alloy layer 36 which mainly contains gold and germanium is deposited in a thickness of approx. 1.5mum on the layer 35, and a gold layer 37 is deposited in a thickness of approx. 1,000Angstrom on the layer 36. The thus treated wafer is divided into individual chips, which are mounted on the leads 22 with the layer 36 as a solder.
申请公布号 JPS5919335(A) 申请公布日期 1984.01.31
申请号 JP19820129781 申请日期 1982.07.26
申请人 TOKYO SHIBAURA DENKI KK 发明人 KOBAYASHI MITSUO;TETSUYA TOSHIO;HATSUTORI TSUKASA
分类号 H01L21/52;H01L21/58;(IPC1-7):01L21/58 主分类号 H01L21/52
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