发明名称 CORRECTION OF CHROMIUM MASK
摘要 PURPOSE:To enable to completely repair the chipping defect of a deposited chromium film by a method wherein, after the chipping defect of the chromium film has been exposed, an etching is slightly performed on the exposed part, and then a chromium film is deposited thereon. CONSTITUTION:A desired pattern is drawn on a metal chromium film 2 located on a glass substrate 1, and a chipping defect 3 comes into presence on a part of said film 2. A positive type resist 4 is applied on the whole surface, and after ultraviolet rays 5 radiate the chipping defect part 3 only, a developing process is performed, and the chipping defect part 3 alone is exposed from the resist 4. Then, an etching is lightly performed on the exposed part which is not covered by the resist 4. Subsequently, a metal chromium 6 is deposited on the whole mask. Lastly, the chromium 6 on the resist 4 is lifted off by exfoliating the resist 4, and the chromium 6 on the exposed part remains, thereby enabling to repair the chipping defect by the remaining chromium 6.
申请公布号 JPS5919322(A) 申请公布日期 1984.01.31
申请号 JP19820129285 申请日期 1982.07.23
申请人 SANYO DENKI KK 发明人 SHIRAKAWA AKIRA
分类号 G03F1/00;G03F1/72;H01L21/027 主分类号 G03F1/00
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