发明名称 DISPLAY DEVICE FOR SEMICONDUCTOR SUBSTRATE VOLTAGE
摘要 PURPOSE:To observe easily only the voltage level of a substrate in a desired specific area in a short time, by selecting and outputting voltage distribution data as specified, and displaying it. CONSTITUTION:A scanning type electron microscope 30 detect voltage distribution data on >=3 areas of the substrate. Then, the value of a specified area among those detected values is selected by a processing circuit 31. A switching circuit 32 sends out either of the selected output of the circuit 31 or the output of the microscope 30 and it is passed through a video processing circuit 33, etc., and displayed on a video display device 34. Thus, the voltage level of the substrate in a desired specific area is observed easily in a short time to check the substrate adequately.
申请公布号 JPS5917167(A) 申请公布日期 1984.01.28
申请号 JP19820127119 申请日期 1982.07.21
申请人 TOKYO SHIBAURA DENKI KK 发明人 SANO TETSUYA;MIYOSHI MOTOSUKE
分类号 G01R19/155;G01R31/265;G01R31/302 主分类号 G01R19/155
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