| 摘要 |
PURPOSE:To adopt constitution enabling simultaneously testing a plurality of semiconductor devices systematically, and to realize an efficient test set for the semiconductor devices of a small machine index by setting up a plurality of chute timing control mechanisms, in which detectors, vane air cylinders and blow nozzles are combined in a set, along a chute row. CONSTITUTION:The semiconductor devices are separated from a supply chute section 20 one by one, and chuted to the chute row 14. The detector 15a detects the chuting and the vane air cylinder 16a is projected, and the semiconductor device is retained by the vane air cylinder 16a. When the next semiconductor device is chuted, the detector 15b detects the chuting and the vane air cylinder 16b is projected, and the semiconductor device is moored in the chute row 14 by the vane air cylinder 16b. The two semiconductor devices are encased in the fixed chute device 11, and the semiconductor devices, retention thereto is released, are chuted to a test head section 30. |
