发明名称 SUBSTRATE FOR PHOTOMASK BLANK APPLIED WITH MARKING
摘要 PURPOSE:To discriminate a substrate with a semipermanent symbol and to eliminate any harm in making circuit patterns, by applying a lustrous marking by laser working in the matted part in the peripheral part on the side of the substrate. CONSTITUTION:A substrate for a photomask blank in a matted state having the as-cut-out peripheral part on the side is set as a work piece in a laser working machine, then the laser light from a laser oscillator is irradiated through a lens 8 to a mask 7 having a prescribed symbol to be marked. A prescribed symbol 9 in a lustrous state is thus obtd. in the matted part 10 in the peripheral part on the side of the substrate. The symbol is the sharp symbol marked on the matted part as a background, and permits identification of the kinds of mat and thin films with checking at just one place, and gives no harms in the post stage of forming patterns for IC circuits. Equally good results are obtained by using electron beam working and ultrasonic working.
申请公布号 JPS5915938(A) 申请公布日期 1984.01.27
申请号 JP19820126041 申请日期 1982.07.19
申请人 HOYA DENSHI:KK 发明人 ASAKAWA KAZUFUMI
分类号 G03F1/00;G03F1/38;H01L21/027 主分类号 G03F1/00
代理机构 代理人
主权项
地址