摘要 |
The invention relates to a method and a device for measuring values of the reactive impedance of an electrical component, the component (Lx) to be measured altering the resonant frequency of an oscillator circuit (OS). For determining, in particular, the values of inductance of the component (Lx) without error, separate connecting lines (V1, V2) are run from the foils of a predetermined capacitor (Cm) to the oscillator circuit (OS) and to the component (Lx) to be measured. The remaining additive disturbing influence of the inductance of the conducting lines (V1, V2) can thus be compensated for in a simple manner. <IMAGE>
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