| 摘要 |
PURPOSE:To detect easily a faulty area, by having a multiplex structure for an address space of a master memory set to a tester of a microcomputer and then using selectively the address space. CONSTITUTION:An ROM corresponding to the set address of a setter 18 within a program ROM group 6 of a microcomputer 9 to be tested and disabled by the connection of a tester 10 is enabled by a test program of an ROM13 of the tester 10 of a microcomputer. This enabled ROM is compared with the contents of a master ROM15 of the tester 10 in response to the program of the ROM13. Then a test is carried out. In this case, a jump is given to the program of the ROM13 having equivalent program when the ROM13 overlaps the address of the group 6, and the address space is replaced within the ROM13 when the addresses overlap among the ROM15, an I/017 and the group 6. Thus a faulty area can be detected easily and accurately by making use of those multiplex address spaces. |
