发明名称 EMISSION SPECTROCHEMICAL ANALYSIS
摘要 PURPOSE:To perform analysis with high sensitivity and high accuracy, by maintaining a source of high frequency-induced and combined plasma in a specified gaseous atmosphere, and thereby suppressing the background of the emission spectrum low and safe. CONSTITUTION:A supporting metallic fitting 4 is provided to the quartz tube 1 of a plasma torch, and supports >=1 gas-blowing tubes (two as 51 and 52 in the figure). >=1 gases selected from a group of He, Ne, Ar, Kr, Xe and N2 are blown to a plasma source 3 to prevent the appearance of band spectrum's background produced by biatomic molecule such as NO, CH, OH, NH, CN. Thus emission spectrochemical analysis is performed with high accuracy and high sensitivity with the use of a high frequency-induced and combined plasma as a beam source 3.
申请公布号 JPS5910836(A) 申请公布日期 1984.01.20
申请号 JP19820119910 申请日期 1982.07.12
申请人 ONODA CEMENT KK 发明人 FURUTA RIKIHISA;MIHARA YASUHISA
分类号 G01N21/73;(IPC1-7):01N21/73 主分类号 G01N21/73
代理机构 代理人
主权项
地址