发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To obtain a high quality N type crystal layer, without the effects of delicate change in heat treating conditions and a minute amount of impurities, by thermally diffusing In in Hg1-xCdxTe (0<=x<=1) and providing an N layer. CONSTITUTION:Hg and Cd, whose vapor pressure is high, are evaporated during the crystal growing from Hg1-xCdxTe and defects are liable to occur. The thin film crystal of the Hg1-xCdxTe incurs serious damage owing to said defects. Vacant holes, from which Hg and Cd are evacuated, become acceptors, and a P type semiconductor is obtained in general. Heat treatment of said P type crystal is performed under the vapor pressure of the Hg and Cd, and the P type crystal can be changed into an P or N type crystal, whose carrier concentration is further lower. Even in this case, however, the crystal is liable to receive the effects of heat treating conditions and impurities, and a high quality film is head to obtain. When In is thermally diffused on the entire or partial surface of an N or P type Hg1-xCdxTe layer, which has high resistivity and low mobility, a high quality N type crystal, which has low resistivity and high mobility, can be readily obtained, and various functional elements can be constituted.
申请公布号 JPS599977(A) 申请公布日期 1984.01.19
申请号 JP19820119364 申请日期 1982.07.07
申请人 MITSUBISHI DENKI KK 发明人 NAGAHAMA KOUKI;OOKATA RIYOUJI;MUROTANI TOSHIO
分类号 H01L31/10;H01L21/385 主分类号 H01L31/10
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