发明名称 TEST SYSTEM FOR CONTROLLER OF INPUT*OUTPUT DEVICE
摘要 PURPOSE:To carry out a diagnosis of the controller with addition of a simple element, by reading in or out the test information through the input and output terminals of the channel interface of the controller by means of the service processor link to the input/output device. CONSTITUTION:Channel interface 10 is connected to input/output (I/O) controller 12 connected to I/O device 26 via OR gates 16 and 18, along with connection of service processor (SVP) 14 secured via OR gate 24. At the same time, the output supplied from SVP14 is connected to gates 16 and 18 via tag-out register 20 and bus-out register 22. Thus the service processor link of SVP14 can be used to I/O device 26. Then the test information is read in or out through the input and output terminals of interface 10. As a result, the diagnosis of the controller can be carried out in a simple way without utilizing the repair panel or the like.
申请公布号 JPS5622119(A) 申请公布日期 1981.03.02
申请号 JP19790097620 申请日期 1979.07.31
申请人 FUJITSU LTD 发明人 ANDOU TOORU;KAWANISHI KIYOSHI;WAKABAYASHI MASAMI;TSUJITA HIROYUKI
分类号 G06F11/22;G06F3/00;G06F13/00 主分类号 G06F11/22
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