发明名称 DEVELOPING METHOD
摘要 PURPOSE:To obtain a photoresist pattern with high precision and extremely high reproductivity and suitable for fine processing, by wetting the entire surface of a water with a surfactant, and dropping a developing soln. on it, and retaining it for a prescribed time on it. CONSTITUTION:The wafer 6 is supported with a vacuum chuck, and a nonionic solvent diluted in water to the order of ppm is sprayed over the wafer 6 from the nozzle of a developing cup 11 so as to wet it throughout the entire surface, while the safer 6 is rotated 17. A prescribed amt. of developing soln. is dropped from a developing nozzle 9. After developing it for a prescribed time, a rinse soln. is ejected from a rinse nozzle 10, and the surface of the wafer 6 is washed for a prescribed time while the wafer 6 is rotated. Then, the wafer 6 is rotated to dry it by blowing gaseous nitrogen or hot air on the wafer. As a result, development of extremely excellent in reproductivity and high in precision can be carried out.
申请公布号 JPS597949(A) 申请公布日期 1984.01.17
申请号 JP19820117524 申请日期 1982.07.06
申请人 NIPPON DENKI KK 发明人 MOTODO NOBUO
分类号 G03F7/30 主分类号 G03F7/30
代理机构 代理人
主权项
地址