发明名称 |
ELECTRON-RAY DRAWING DEVICE |
摘要 |
PURPOSE:To adjust a focus easily, and to enable drawing at high speed by forming a cross wire used for measuring electron rays in the same plane as a reference mark for correcting a deflected strain of electron rays. CONSTITUTION:Electron rays with a sectional shape of a circle or a rectangle or the like are shrunk and deflected in predetermined size, and a fine pattern is formed onto the surface of a sample 12. The cross wire 19 used for measuring electron rays is formed in the same plane as the surface of the reference marks 20 for correcting the deflected strains at that time. Accordingly, the results of measurement of the size and dimming and the like of shaped electron rays adjusted on the wire 19 agree completely with the results of measurement on the marks 20, and accurate adjustment is enabled. |
申请公布号 |
JPS598333(A) |
申请公布日期 |
1984.01.17 |
申请号 |
JP19820116801 |
申请日期 |
1982.07.07 |
申请人 |
HITACHI SEISAKUSHO KK;NIPPON DENSHIN DENWA KOSHA |
发明人 |
IWASAKI TERUO;YANAGISAWA AKIRA;KOMATA FUJIO |
分类号 |
H01J37/305;H01J37/304;H01L21/027 |
主分类号 |
H01J37/305 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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