发明名称 |
Measuring apparatus for X-ray fluorescence analysis |
摘要 |
A measuring apparatus for X-ray fluorescence analysis in which the specimen is stimulated by glancing incident radiation and is examined spectrometrically by a detector disposed above the specimen. In the path of rays of the stimulating X-radiation there is disposed a reflector which in operation deflects the X-radiation to the surface of the specimen.
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申请公布号 |
US4426717(A) |
申请公布日期 |
1984.01.17 |
申请号 |
US19800133556 |
申请日期 |
1980.03.24 |
申请人 |
GESELLSCHAFT FUER KERNENERGIEVERWERTUNG IN SCHIFFBAU UND SCHIFFAHRT MBH |
发明人 |
SCHWENKE, JOACHIM;KNOTH, JOACHIM;MARTEN, RAINER;ROSOMM, HERBERT |
分类号 |
G01N23/223;(IPC1-7):G01N23/22 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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