发明名称 MANUFACTURE OF MULTILAYER WIRING STRUCTURE
摘要 PURPOSE:To remove the stepped difference in a surface, and to improve inter- layer adhesiveness remarkably by using polyimide containing a proper quantity of a silane coupling agent as an inter-layer resin layer. CONSTITUTION:A silicon dioxide film 12 is formed to the surface of a semiconductor substrate 1. The resin film 14 is formed while coating a first wiring conductor layer 13 with a predetermined wiring pattern. A desired window hole 14' for conduction is formed to the resin film 14, a second wiring conductor layer 15 is laminated on the window hole, and other wiring conductor layers are formed as required. A material in which the silane coupling agent of 0.1- 15wt% to a polyimide resin is mixed is used as the resin film 14. A material having high heat resistance is selected and used in consideration of the manufacturing processes, etc. of the multilayer wiring structure as the silane coupling agent.
申请公布号 JPS595648(A) 申请公布日期 1984.01.12
申请号 JP19820114088 申请日期 1982.07.02
申请人 OKI DENKI KOGYO KK 发明人 OGURA KEN
分类号 H01L21/768;H01L21/312;H01L23/522 主分类号 H01L21/768
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