发明名称 METHOD FOR CORRECTING TIMING OF TEST APPARATUS
摘要 PURPOSE:To maintain timing preciseness without taking a time for correcting timing, by a method wherein rest time generated during the practice of a test is assigned to the correcting time of a timing signal and correction is succeesively carried out with respect to every arbitrary number of timing signals at every generation of the rest time. CONSTITUTION:When a test practice control apparatus 2 receives test practice starting from a system control apparatus 1, it operates pin electronics 3 practically equipped with a drive circuit or a logical comparator to carry out the practice of a test and, when the test is finished, carries out finishing information with respect to the control apparatus 1. When an auto-handler control apparatus 5 receives auto-handler operation starting from the control apparatus 1, an auto- handler 6 is operated to set an object to be tested to the pin electronics 3 in a testable manner and, when setting operation is finished, it informs termination to the system control apparatus 1. When correcting operation starting is received, timing correcting operation is carried out and, when it is finished, the information of termination is carried out with respect to the control apparatus 1. By this method, timing preciseness can be kept extremely high.
申请公布号 JPS593275(A) 申请公布日期 1984.01.09
申请号 JP19820112110 申请日期 1982.06.29
申请人 HITACHI SEISAKUSHO KK 发明人 YOSHINO RIYOUZOU;KATOU MASAO
分类号 G01R31/28;G01R31/319;G01R35/00;(IPC1-7):01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址