| 摘要 |
PURPOSE:To improve production capability and reliability, by fetching picture data from a testing device, judging it through the pattern recognition of a microcomputer, etc., and automating waveform testing operation. CONSTITUTION:An IC3 is sent to a contact part 13 by an automatic IC loading part 11 and a conveyance part 12. The testing device 6 projects an AC test waveform on a cathode-ray tube 7. The picture is taken by a camera 14 and picture data on it is fetched in the microcomputer 16, which performs pattern recognition. Then, data inputted from an interface 15 and a nondefective article pattern, etc., in the microcomputer 16 are compared to send a nondefective/ detective decision signal to an interface 17 and a nondefective/detective selection part 18 is operated to make nondefective/defective selection. Thus, the waveform test is automated, so the production capacity and reliability are improved. |
