发明名称 Loop fault location
摘要 Circuitry, and associated methodology, for locating resistive shunt faults on a cable pair comprises DC source (120) and current sensors (121,122) which provide measured information utilized to estimate the resistance of the pair between the fault and a test position. In locating faults of a single-sided nature, two sets of measurements, either absolute or ratio type, are effected from the test position with the pair shorted at a point beyond the fault. In locating double-sided faults, three sets of current dependent measurements are taken at the measurement point. A reference pair is required for double-sided faults, and various strapping arrangements between the pair under test and the reference pair are required at a point beyond the fault depending on the required set of measurements.
申请公布号 US4424479(A) 申请公布日期 1984.01.03
申请号 US19810308417 申请日期 1981.10.05
申请人 BELL TELEPHONE LABORATORIES, INCORPORATED 发明人 BROWN, JAMES M.
分类号 G01R31/08;(IPC1-7):G01R31/08;H04B3/46 主分类号 G01R31/08
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