发明名称 DEFECT INSPECTION SYSTEM
摘要 <p>A defect inspection system in which a reflector body is arranged at such an angle relative to an object to be inspected that in spite of any parallel movements of the image does not overlap the inspected object. The inspected object and the image thereof are both simultaneously picked up by the same television camera. Then, the video signal from the television camera is fed to a processor which then inspects whether or not the object to be inspected contains defects or flaws.</p>
申请公布号 CA1158743(A) 申请公布日期 1983.12.13
申请号 CA19810371383 申请日期 1981.02.20
申请人 HAJIME INDUSTRIES LTD. 发明人 YOSHIDA, HAJIME
分类号 G01B11/02;G01N21/84;G01N21/88;(IPC1-7):G08B23/00 主分类号 G01B11/02
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