| 摘要 |
PURPOSE:To shorten the stabilizing time of electrostatic capacity and to improve the efficiency of automatic selection, by connecting a measuring circuit through a resistance circuit which applies a specified potential to an open electrode of a transistor. CONSTITUTION:For example, when the electrostatic capacity Cob between the collector C and base B of the transistor TR to be measured is measured, a stabilized power source is connected in such a way that a positive potential is applied to the collector C and a negative potential is applied to the base. Then, output terminals led out from the collector C and base B are connected to the measuring circuit through capacitors C1 and C2 for cutting off DC components. Further, the base and emitter E are connected together through a resistance Rbe for stabilizing the emitter potential and the electrostatic capacity Cob is measured. Consequently, the stabilizing time is shortened without varying a measured voltage capacity value to improve the efficiency of automatic selection. |
