发明名称 X-Y INFRARED CCD SENSOR AND METHOD FOR MAKING SAME
摘要 <p>An x-y infrared CCD sensor employing the photoelectric effect as in a p-doped semiconductor substrate of silicon with an n+pn diode as the infrared sensor element with a three layer structure in the vertical direction in the semiconductor substrate and a n-channel charge coupled device shift register. The device has a metal-oxide-semiconductor storage electrode directly adjacent to the n-region of the three layer structure. The device is manufactured by masked ion implantation with the doping density for the three layer sequence such that the doping density for the layer operating as the emitter is greater than the doping density for the layer operating as a base, which in turn is greater than the doping density for the layer operating as the collector.</p>
申请公布号 CA1158349(A) 申请公布日期 1983.12.06
申请号 CA19800363061 申请日期 1980.10.23
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 RISCH, LOTHAR;MADER, HERMANN
分类号 H04N5/33;H01L27/146;H01L27/148;(IPC1-7):H01L31/08 主分类号 H04N5/33
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