发明名称 |
Stress-compensated quartz resonators |
摘要 |
A stress compensated thickness-shear resonator is of an orientation (yxwl) phi / theta selected from loci of stress compensated orientations provided for both the fast and slow thickness-shear modes of vibration. A stress compensated orientation is used in an oscillator for stable frequency-stress behavior. A stress compensated orientation having large-valued temperature coefficients of frequency is used in a temperature sensor for precision measurements. A stress and temperature compensated orientation is used in a pressure sensor such that the temperature compensated thickness-shear mode is used for pressure measurement while the stress compensated thickness-shear mode is used to compensate for effects of temperature.
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申请公布号 |
US4419600(A) |
申请公布日期 |
1983.12.06 |
申请号 |
US19810267507 |
申请日期 |
1981.05.27 |
申请人 |
SCHLUMBERGER TECHNOLOGY CORPORATION |
发明人 |
SINHA, BIKASH K. |
分类号 |
H03H9/02;H03H9/19;(IPC1-7):H01L41/08 |
主分类号 |
H03H9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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