| 摘要 |
PURPOSE:To perform efficiently a test by plural patterns in the same input pattern, by selecting each bit which paralleling both positive and negative signals of one word scanned-in to an input register. CONSTITUTION:A specified one word test pattern is stored in an input register forming a shift register with a scan-in signal, and a register 1 outputs a positive and negative signals in parallel for each bit. One of the parallel outputs is selected by a multiplexer 2 according to a selection signal and supplied to an LSI built-in memory 3 and a comparator 5. The comparator 5 compares the read out output of the memory 3 to test the quality of the memory 3. As the result, the test of the LSI built-in memory is efficiently performed by the test of various patterns based on the same test pattern with one time the scan-in. |
