发明名称 ELECTRON MICROSCOPE
摘要 PURPOSE:To display a transmitted image and a diffracted image of a sample constantly at the same time by having an aperture, which is arranged near the rear surface of an objective allowing only the zero diffraction electron rays to pass through, and preparing a pickup means, which converts the diffraction electron ray image into an electric signal, as well as a display means. CONSTITUTION:The zero diffraction electron rays transmitted by a sample 1 pass through an aperture 9 of a glass plate 7 as well as an intermediate lens 4 and a pickup lens 5 while being projected on a phosphor plate 6 to form a sample image. At the same time, diffracted image is formed on the glass plate 7 by the electron rays transmitted by the sample and the phosphor coating varnish applied on the glass plate 7 converts a diffraction pattern into an optical image while being detected by a solid image sensor 8 to display the diffraction pattern image on a cathode-ray tube 11.
申请公布号 JPS58206036(A) 申请公布日期 1983.12.01
申请号 JP19820089097 申请日期 1982.05.26
申请人 NIPPON DENSHI KK 发明人 WATANABE EIICHI
分类号 H01J37/22;H01J37/26 主分类号 H01J37/22
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