发明名称 Ion implanter for oxygen ion implantation into a silicon wafer
摘要 An ion implanter has an electron beam irradiation system which removes impurity ions generated by an electron source. An ion implanter comprises a system for directing a beam (100) from an ion beam generator source (34) towards a wafer (26), a system for transforming electrons generated by an electron source (50) into an electron beam (102), and an electron beam irradiation system for separating the electron beam (102) from an associated impurity ion beam generated by the electron beam generator system.
申请公布号 FR2776123(A1) 申请公布日期 1999.09.17
申请号 FR19990002998 申请日期 1999.03.11
申请人 HITACHI LTD 发明人 TOMITA HIROYUKI;MERA KAZUO
分类号 C23C14/00;C23C14/48;H01J37/02;H01J37/317;H01L21/265;(IPC1-7):H01J37/317 主分类号 C23C14/00
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