发明名称 |
Ion implanter for oxygen ion implantation into a silicon wafer |
摘要 |
An ion implanter has an electron beam irradiation system which removes impurity ions generated by an electron source. An ion implanter comprises a system for directing a beam (100) from an ion beam generator source (34) towards a wafer (26), a system for transforming electrons generated by an electron source (50) into an electron beam (102), and an electron beam irradiation system for separating the electron beam (102) from an associated impurity ion beam generated by the electron beam generator system.
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申请公布号 |
FR2776123(A1) |
申请公布日期 |
1999.09.17 |
申请号 |
FR19990002998 |
申请日期 |
1999.03.11 |
申请人 |
HITACHI LTD |
发明人 |
TOMITA HIROYUKI;MERA KAZUO |
分类号 |
C23C14/00;C23C14/48;H01J37/02;H01J37/317;H01L21/265;(IPC1-7):H01J37/317 |
主分类号 |
C23C14/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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