发明名称 Method or determining phase distributions and differences in light and infrared beams for use in non-destructive testing
摘要 The workpiece (2) is radiated under at least two strains with partially coherent monochromatic light (1), to form images on CCD sensors in a focal plane (5) and superimposed with a reference beam of the same frequency and fixed phase shift. The contrast is determined from the intensity of the speckle pattern. The speckles generate background noise in the focal plane. The method is based on the phase displacement method for analyzing images produce by hologram interferometers. Distribution and difference can be determined from background noise and contrast in a single measurement. An Independent claim is included for a device for performing the method.
申请公布号 DE19814221(A1) 申请公布日期 1999.10.07
申请号 DE19981014221 申请日期 1998.03.31
申请人 STEINCHEN, WOLFGANG 发明人 STEINCHEN, WOLFGANG;KUPFER, GERHARD;YANG, LIANXIANG;MAECKEL, PETER;VOESSING, FRANK
分类号 G01J9/04;(IPC1-7):G01J9/04 主分类号 G01J9/04
代理机构 代理人
主权项
地址