发明名称 BLANK FOR CHROMIUM MASK
摘要 PURPOSE:To obtain a blank giving a hard photomask for manufacturing a semiconductor integrated circuit at a high etching speed with superior productivity, by forming a chromium layer contg. carbon and a chromium oxide layer on a substrate. CONSTITUTION:Chromium is deposited on a substrate by vapor deposition or sputtering in an atmosphere contg. a compound having carbon in the molecule such as methane or acetylene to form a chromium layer contg. about 0.001- 30wt% carbon, and a chromium oxide layer is formed on the chromium layer to obtain a blank for a photomask. Carbon may be also contained in the chromium oxide layer A. photoresist layer is formed on the blank, imagewise exposed, and developed to imagewise disclose the suface of the blank. The chromium oxide layer and the chromium layer are then dry-etched to manufacture a hard mask for manufacturing a semiconductor integrated circuit, etc.
申请公布号 JPS58195846(A) 申请公布日期 1983.11.15
申请号 JP19820078996 申请日期 1982.05.10
申请人 KONISHIROKU SHASHIN KOGYO KK 发明人 UEHARA KEIKO;HATANO TAKASHI
分类号 G03F1/00;G03F1/54;H01L21/027 主分类号 G03F1/00
代理机构 代理人
主权项
地址