发明名称 Circuit synthesis testing cut=out capacity - has element with capacitance equal to multiple that of HV circuit at start, with control
摘要 <p>The synthetic circuit, is used to test the cut out capacity of a high voltage power switch. It consists of a heavy current circuit in which the test element is connected in series with an auxiliary switch and a capacitance and a self-inductance formed by the adjustable spark gap. An oscillating voltage is produced when the heavy current circuit is broken. An element of the high voltage circuit (14) has a capacitance (20) which is approximately five-twenty times the initial capacitance of the high voltage circuit. It is linked by means of a control unit (22). It is connected in parallel to reduce the frequency.</p>
申请公布号 DE2112435(C2) 申请公布日期 1983.11.10
申请号 DE19712112435 申请日期 1971.03.09
申请人 SIEMENS AG, 1000 BERLIN UND 8000 MUENCHEN, DE 发明人 SLAMECKA, ERNST, DR.TECHN.;PFLAUM, ECKHARD, DR.-ING.;RUHNAU, WOLFGANG, 1000 BERLIN, DE
分类号 G01R31/333;(IPC1-7):01R31/32 主分类号 G01R31/333
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