发明名称 Low resistance ohmic contact
摘要 A method for obtaining a very low resistance ohmic contact on p-type Indium Phosphide (InP) by light-assisted plating of Au and Zn. The plating technique, which uses alternating positive and negative current pulses, has been used for producing patterned, small area contacts on device structures and is compatible with established n-type ohmic contacting procedures.
申请公布号 US4414076(A) 申请公布日期 1983.11.08
申请号 US19830471098 申请日期 1983.03.01
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 TABATABAIE-ALAVI, KAMAL;CHOUDHURY, ABU N. M. M.;GABRIEL, NANCY J. (SLATER);FONSTAD, CLIFTON G.
分类号 C25D5/02;C25D5/10;C25D5/18;H01L21/288;(IPC1-7):C25D5/02 主分类号 C25D5/02
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