| 发明名称 |
Radiation measuring chamber |
| 摘要 |
The invention relates to a radiation measuring chamber for measuring the radiation from samples, in which the measuring chamber consists of at least two parts and one part is constructed as sample dish in which the sample can be arranged, at least the surface (19) of the sample dish (9), in which the sample (11) is arranged, consisting of plastic. <IMAGE>
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| 申请公布号 |
DE3216055(A1) |
申请公布日期 |
1983.11.03 |
| 申请号 |
DE19823216055 |
申请日期 |
1982.04.29 |
| 申请人 |
SIEMENS AG |
发明人 |
SCHINDLBECK,GUENTER,DIPL.-ING. |
| 分类号 |
G01T7/02;H01J47/02;(IPC1-7):G01T1/16;G01T1/18;G01T1/20;H01J47/00 |
主分类号 |
G01T7/02 |
| 代理机构 |
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