发明名称 Polycrystalline resistor manufacturing method, involves doping polycrystalline resistance path such that one part of resistance path is doped and another part of resistance path is not doped
摘要 <p>The method involves providing a polycrystalline resistance path (110), where the resistance path comprises a semiconductor material e.g. silicon. The polycrystalline resistance path is doped in a manner such that one part (111) of the polycrystalline resistance path is doped and another part (112) of the polycrystalline resistance path is not doped. An implanted protective layer (140) is produced on the latter part of the polycrystalline resistance path. Independent claims are also included for the following: (1) a polycrystalline resistor comprising a polycrystalline resistance path (2) a device for providing a layout of polycrystalline resistor.</p>
申请公布号 DE102006011708(A1) 申请公布日期 2007.09.20
申请号 DE20061011708 申请日期 2006.03.14
申请人 INFINEON TECHNOLOGIES AG 发明人 LANGDON, STEVEN
分类号 H01L21/822;H01L27/08 主分类号 H01L21/822
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