发明名称 Materials and methods for plasma etching of aluminum and aluminum alloys
摘要 A method for etching a layer of aluminum or aluminum alloy on a semiconductor wafer using the steps: disposing the wafer on one of a pair of electrode structures in a closed chamber; communicating into the chamber a reactive gas mixture comprising a principal gas mixture of BCl3 and Cl2 and a dopant gas of oxygen and fluorocarbon gas; and supplying radio frequency electrical energy to one of the electrode structures to create a plasma of the reactive gas mixture for etching the aluminum layer.
申请公布号 US4412885(A) 申请公布日期 1983.11.01
申请号 US19820438786 申请日期 1982.11.03
申请人 APPLIED MATERIALS, INC. 发明人 WANG, DAVID N.;EGITTO, FRANK D.;MAYDAN, DAN
分类号 C23F1/00;C23F4/00;H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):C23F1/02 主分类号 C23F1/00
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