发明名称 PROCESS AND APPARATUS FOR MEASURING DISTANCE BY LASER INTERFEROMETRY WITH TWO WAVELENGTHS
摘要 The apparatus and method include adjusting two single frequency lasers to separate longitudinal modes of an interferometer, the plates of which are separated by a distance to be measured. A rough estimate of the distance is made using a tape measure or the like. The rough estimate, together with the frequency distance ( DELTA F) of the lasers adjusted to the longitudinal modes of the interferometer is used to solve the equation: <IMAGE> where c is the speed of light and L1 is the rough estimate. The parameter k then calculated by rounding k1 to the nearest integer and the accurate distance L is calculated according to the equation: <IMAGE>
申请公布号 DE3064960(D1) 申请公布日期 1983.10.27
申请号 DE19803064960 申请日期 1980.10.16
申请人 ANVAR AGENCE NATIONALE DE VALORISATION DE LA RECHERCHE 发明人 BOURDET, GILBERT LOUIS JACQUES;FRANCO, MICHEL ALAIN FERNAND
分类号 G01B9/02;G01B11/14;(IPC1-7):G01B9/02 主分类号 G01B9/02
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