发明名称 Method and arrangement for quantitative potential measurements on surface-wave filters
摘要 For quantitative potential measurement of surface-wave filters, an alternating voltage with amplitude UEi is connected to an input transducer of the surface-wave filter. At a local region for measurement on the filter, an alternating voltage of amplitude UP arises. For each such measuring location, the voltage UP is compared to a nominal value and if it deviates therefrom, this deviation is utilized to control an amplitude of the input voltage UEi so as to maintain the voltage UP substantially constant. For the various measurement locations, the changes of the input voltage UEi are analyzed and a local attenuation factor for each measured region in the filter may be determined. By knowing a frequency of the driving alternating voltage, conclusions can be drawn concerning specific characteristics of the filter.
申请公布号 US4412191(A) 申请公布日期 1983.10.25
申请号 US19810287133 申请日期 1981.07.27
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 FEUERBAUM, HANS P.;TOBOLKA, GERALD
分类号 G01R19/155;G01R29/14;G01R31/302;G01R31/305;(IPC1-7):H03H9/64;H03H9/00 主分类号 G01R19/155
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