发明名称 Method of and system for measuring temperature and spectral factor
摘要 Methods and systems for measuring the temperature and spectral factors of a number of specimens (or radiators). The radiant flux from the specimens are spectrally analyzed with respect to effective wavelengths from M different channels (M being greater than or equal to 3). A relation among the spectral radiant flux intensity, approximated spectral factor (depending only on wavelength) and the temperature is determined for each channel by using Planck's radiation law with the condition that a relation N+K=M is kept among M of the number of channels, N of the number of specimens with unknown temperature values and K of the number of unknown terms of the approximated spectral factor of the specimens. Strict algebraic development of such relation is employed to cancel out all of the unknown terms of the spectral factor to obtain a one-dimensional equation concerning the sole temperature. Such equation is solved to determine the temperature of the specimens, and the spectral factor of the specimens is obtained from the determined temperature values and the aforesaid relation.
申请公布号 US4411519(A) 申请公布日期 1983.10.25
申请号 US19800181745 申请日期 1980.08.27
申请人 ISHIKAWAJIMA-HARIMA HEAVY INDUSTRIES CO., LTD. 发明人 TAGAMI, ICHIZO
分类号 A61B5/01;G01J5/60;(IPC1-7):G01J5/60;G01N21/27 主分类号 A61B5/01
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