发明名称 |
Selective chemical milling of recast surfaces |
摘要 |
Disclosed is a process for machining nickel-base superalloys wherein a thermal-effect process, such as laser or electric discharge machining, is first used to remove material but leaves a recast layer. Next a chemical milling process is used wherein the etchant only attacks and removes the recast layer. The etchant is comprised by volume percent of 40-60 HNO3, 5-20 HCl, and balance H2O, with which is included 0.008-0.025 moles/liter FeCl3 and at least 0.016 moles/liter CuSO4. The FeCl3 improves removal rate but tends to cause unwanted pitting and intergranular attack. These tendencies are inhibited by the addition of CuSO4; preferably the molar ratio of CuSO4 to FeCl3 is 2:1. The beneficial combination of FeCl3 and CuSO4 is usable in other etchants.
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申请公布号 |
US4411730(A) |
申请公布日期 |
1983.10.25 |
申请号 |
US19820338739 |
申请日期 |
1982.01.11 |
申请人 |
UNITED TECHNOLOGIES CORPORATION |
发明人 |
FISHTER, ROBERT E.;LADA, HENRY |
分类号 |
C23F1/20;C23F1/28;(IPC1-7):C23F1/00;B23K9/00;C09K13/04 |
主分类号 |
C23F1/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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