THE CONNECTING DEVICE FOR BURN IN TESTING EQUIPMENT

摘要

A connecting device of a burn-in test apparatus is provided to perform compatibility with an initial error detection test process of a semiconductor device using a burn-in board increasing the number of connection pins. A plurality of expansion boards is equipped in the sidewall of a test room of a chamber. A connector(1) is installed in the end section of each expansion board. The connector includes a first connection terminal and a second connection terminal which are arranged in two columns and symmetrical up and down. A burn-in board(130) includes a plurality of sockets in which the semiconductor device is mounted. The connection terminal(2) is formed in the burn-in board in order to connect the burn-in board with the expansion board electrically. The first connection pin and the second connection pin of two front and rear columns are formed in the connection terminal of the burn-in board. The first connection pin and the second connection pin are alternatively arranged.