Apparatus and method for precise determinations of crystallographic orientation in crystalline substances
摘要
An apparatus and method for precisely measuring the angles of cut of single and doubly rotated cuts of quartz crystal blanks on a high volume production basis.
申请公布号
US4412345(A)
申请公布日期
1983.10.25
申请号
US19810289353
申请日期
1981.08.03
申请人
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY
发明人
WORKMAN, S. THOMAS;CHAMBERS, JOHN L.;PUGH, MYRON A.;WARD, ROGER W.
