发明名称 ELLIPSOMETER COMPLEX FOR HIGH-TEMPERATURE RESEARCH
摘要 FIELD: physics. ^ SUBSTANCE: complex includes unit of optic measurements, system for heating of researched samples, system for temperature control and calculating unit. Unit of optic measurements based on fast-acting ellipsometer is equipped with microscope objective for focusing of probing radiation at researched sample, diaphragm and light filter that prevent ingress of parasite radiation into measuring track. In system for heating supply contacts to heater are made of graphite, with surface lubricated by liquid gallium. Heating system may be equipped with jacket that isolates it from external atmosphere with the possibility to realise flow mode of inertial gas. Analog-measuring part of control calculating unit is arranged in the form of four channels for signal reading from unit of optical measurements. Every channel is equipped with controller of amplifier ratio connected to inlet of analog-digital transducer. Microcontroller system comprises subsystems for data accumulation, subsystems for predicative control of amplifier ratio, subsystem for measurement of temperature and subsystem of data transmission to personal computer. ^ EFFECT: increased accuracy of measurements. ^ 7 cl, 2 dwg
申请公布号 RU2353919(C1) 申请公布日期 2009.04.27
申请号 RU20070137742 申请日期 2007.10.11
申请人 INSTITUT FIZIKI POLUPROVODNIKOV SIBIRSKOGO OTDELENIJA ROSSIJSKOJ AKADEMII NAUK;ZAKRYTOE AKTSIONERNOE OBSHCHESTVO NAUCHNO-PROIZVODSTVENNAJA KOMPANIJA "TSENTR NANOTEKHNOLOGIJ" 发明人 RYKHLITSKIJ SERGEJ VLADIMIROVICH;SHVETS VASILIJ ALEKSANDROVICH;PROKOP'EV VITALIJ JUR'EVICH;SPESIVTSEV EVGENIJ VASIL'EVICH
分类号 G01N21/21 主分类号 G01N21/21
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